A. Blacha, R. Clauberg, et al.
IEEE T-ED
We report on the first voltage measurements of signals with rise times below 20 ps by photoemission sampling based on the single-photon process. The high time and voltage resolution together with the potential of a submicrometre spatial resolution enables testing of very high-speed VLSI circuits by this newly developed method. © 1987, The Institution of Electrical Engineers. All rights reserved.
A. Blacha, R. Clauberg, et al.
IEEE T-ED
R. Clauberg, K.H. Frank, et al.
Surface Science
R. Clauberg, P. von Allmen
Electronics Letters
R. Clauberg, H. Beha, et al.
IBM J. Res. Dev