Nicky C.C. Lu, Hu H. Chao, et al.
IEEE Journal of Solid-State Circuits
An MOS comparator circuit capable of detecting difference signals as low as 1 mV in 3 µs has been designed, built, and tested. The circuit does not require high accuracy components or tight control of device parameter tolerances. © 1978, IEEE. All rights reserved.
Nicky C.C. Lu, Hu H. Chao, et al.
IEEE Journal of Solid-State Circuits
Lewis M. Terman, Yen S. Yee, et al.
ISSCC 1981
Walter F. Kosonocky, Lewis M. Terman
ISSCC 1977
Date J. W. Noorlag, Lewis M. Terman, et al.
IEEE Journal of Solid-State Circuits