Conference paper
Programming contests in academic environments
Cheryl L. Morris, Gabriel M. Silberman
FIE 2003
We present an approach to the analysis of combinational gate-level designs, which produces information conducive to the acceleration of the backtracing process, pervasive in automatic test pattern generation algorithms. This analysis yields information which can be used to make intelligent decisions within the search space spanned by the backtracing process. A procedure which embodies this approach is presented, together with experimental results. © 1994.
Cheryl L. Morris, Gabriel M. Silberman
FIE 2003
Shlomit Weiss, Ilan Y. Spillinger, et al.
Journal of Parallel and Distributed Computing
Gabriel M. Silberman, Kemal Ebcioglu
ICS 1992
Gabriel M. Silberman
IEEE TC