Conference paperMechanisms for microstructure evolution in electroplated copper thin filmsJ.M.E. Harper, C. Cabral Jr., et al.MRS Spring Meeting 1999
PaperFull thermoelectric characterization of InAs nanowires using MEMS heater/sensorsSiegfried F. Karg, V. Troncale, et al.Nanotechnology
PaperAlpha particle mitigation strategies to reduce chip soft error upsetsC. Cabral, K.P. Rodbell, et al.Journal of Applied Physics
Conference paperElecromigration damage in fine Al alloy lines due to interfacial diffusionC.-K. Hu, M.B. Small, et al.MRS Proceedings 1993