Conference paperNEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.S. Cohen, T.O. Sedgwick, et al.MRS Proceedings 1983
PaperA surface core-level shift photoemission study of the interaction of oxygen with W{100}P. Alnot, D.J. Auerbach, et al.Surface Science
PaperAF-Net: An Active Fire Detection Model Using Improved Object-Contextual Representations on Unbalanced UAV DatasetsXikun Hu, Wenlin Liu, et al.IEEE J-STARS