Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
This paper is concerned with the sensitivity of the dynamic response of printed wiring boards (PWB). A general method to study the sensitivity of the response of the board as a function of the variability of the design variables is presented. The method, which is based on a probabilistic approach, assumes that the design variables belong to a given interval and follow a known probabilistic distribution. © 1995 by ASME.
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
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SC 2012