Suhwan Kim, Conrad H. Ziesler
IEEE Design and Test of Computers
Most existing power gating structures provide only one power-saving mode. We propose a novel power gating structure that supports both a cutoff mode and an intermediate power-saving and data-retaining mode. Experiments with test structures fabricated in 0.13-μm CMOS bulk technology show that our power gating structure yields an expanded design space with more power-performance tradeoff alternatives. © 2007, IEEE. All Rights Reserved.
Suhwan Kim, Conrad H. Ziesler
IEEE Design and Test of Computers
Suhwan Kim, Chang Jun Choi, et al.
IEEE Transactions on Electron Devices
Suhwan Kim, Stephen V. Kosonocky, et al.
ISLPED 2004
Suhwan Kim, Youngsoo Shin, et al.
ASIC/SOC 2002