Hot electron emission lithography
M. Poppeller, E. Cartier, et al.
Microlithography 1999
We describe a new two-dimensional detector for the detection of ions scattered from a solid target, analyzed in energy and scattering angle by a toroidal electrostatic analyzer. The detector resolves the scattering angle with a resolution of 0.4° over a range of 25°, and the ion energy with a resolution of 120 eV over a range of 2000 eV, at 100 keV ion energy. The energy resolution of the spectrometer was improved with a factor 4 relative to its previous performance with a one-dimensional scattering angle detector, while-at the same time-the dose efficiency (count/μC) was improved by a factor 5-10.
M. Poppeller, E. Cartier, et al.
Microlithography 1999
R.M. Tromp, James B. Hannon, et al.
Ultramicroscopy
L. Miotti, R.P. Pezzi, et al.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
J. Tersoff, A.W. Denier Van Der Gon, et al.
Physical Review Letters