Se June Hong, Ravi Nair
Proceedings of the IEEE
Paper
A Simple Procedure to Generate Optimum Test Patterns for Parity Logic Networks
Abstract
A simple procedure to produce a minimum length test set for a parity network is presented. If is the largest fan in of any EX-OR gate element in the tree, 2M test patterns are chosen by considering only 2M test sequences, of length 2M, assigned to each signal line. Copyright © 1981 by The Institute of Electrical and Electronics Engineers, Inc.
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