Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
We classify finite-to-one factor maps between shifts of finite type up to almost topological conjugacy. © 1985, Cambridge University Press. All rights reserved.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Charles Micchelli
Journal of Approximation Theory
Nimrod Megiddo
Journal of Symbolic Computation
John S. Lew
Mathematical Biosciences