A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
Extended Hckel theory is applied to GaP, GaAs, and to the nitrogen isoelectronic trap in GaP and GaAs. The theory confirms the A1-symmetric nature of the N-trap electron state NX (the A line in GaP) and lends support to the expectation that even small inward relaxation of the neighboring Ga atoms significantly lowers the NX binding energy (2 eV/). When compared with the results of Hsu's phenomenological one-band model, the present calculations indicate that a quantitative theory of the N trap (and all deep traps) in GaAs1-xPx must accurately account for the electronic structure of both the valence and the conduction bands. © 1980 The American Physical Society.
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals