Optimization of real phase-mask performance
F.M. Schellenberg, M. Levenson, et al.
BACUS Symposium on Photomask Technology and Management 1991
Abstract. Bonferroni‐type inequalities are used to approximate probabilities of the joint distribution of residual autocorrelation coefficients from an autoregressive moving‐average time series model. The approximations are useful for testing the goodness of fit of the model can be used to find critical values of a test of whether the largest residual autocorrelation is significantly different from zero. The approximation based on the first‐order Bonferroni inequality is simple to use and adequate in practice. Copyright © 1993, Wiley Blackwell. All rights reserved
F.M. Schellenberg, M. Levenson, et al.
BACUS Symposium on Photomask Technology and Management 1991
Paul J. Steinhardt, P. Chaudhari
Journal of Computational Physics
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SCC 2007
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Journal of Biomedical Informatics