Atomic-force microscopy

G. Binnig

doi:10.1088/0031-8949/1987/T19A/008

Physica Scripta

Paper

14 Feb 2007

Atomic-force microscopy

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Abstract

Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.

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