Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Motivated by the empirically established universal trends and correlations in the properties of extreme type-II superconductors, we explore the occurrence of analogous behavior in the strong-coupling regime of the three-dimensional Hubbard model with attractive on-site interaction. In this limit we derive scaling relations between the transition temperature, the zero-temperature gap and the penetration depth. We observe a remarkable agreement with the empirical trends. Certain limitations may be attributed to the neglect of charge-density fluctuations. © 1993.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
A. Reisman, M. Berkenblit, et al.
JES
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters