John J. Barton
Physical Review Letters
Angular distribution patterns of Auger electrons and of photoekctrons from a Cu (001) surface were measured at the same electron kinetic energy. These measurements reveal that the low kinetic energy angular distributions for Cu Auger electrons and Cu 3p3/2 photoelectrons differ substantially. This direct comparison between the photoelectron and Auger electron angular distributions demonstrates that, in some circumstances, the Auger process produces a complicated source wave whose nature must be explored before Auger angular distributions can be used for surface structure analysis.
John J. Barton
Physical Review Letters
John J. Barton, Louis J. Terminello
Physical Review B
John J. Barton, Louis J. Terminello
Physical Review B
John J. Barton
Journal of Electron Spectroscopy and Related Phenomena