William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
Black phosphorus is a layered semiconductor that is intensely researched in view of applications in optoelectronics. In this letter, we investigate a multilayer black phosphorus photodetector that is capable of acquiring high-contrast (V > 0.9) images both in the visible (VIS = 532 nm) as well as in the infrared (IR = 1550 nm) spectral regime. In a first step, by using photocurrent microscopy, we map the active area of the device and we characterize responsivity and gain. In a second step, by deploying the black phosphorus device as a point-like detector in a confocal microsope setup, we acquire diffraction-limited optical images with submicron resolution. The results demonstrate the usefulness of black phosphorus as an optoelectronic material for hyperspectral imaging applications.
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
Mark W. Dowley
Solid State Communications