W.J. Kozlovsky, W. Lenth, et al.
Applied Physics Letters
In situ x-ray photoelectron spectroscopy was used to study the oxidation of niobium films covered by some monolayers of cerium. Significant amounts of Nb2O5 are formed at pressures as low as 6.6 × 10-6 Pa, promoted by the cerium overlayer. This catalytic activity is related to the trivalent-to- tetravalent valence change of the cerium during oxidation. The kinetics of Nb2O5 formation beneath the oxidized cerium shows two stages; the first is fast growth limited by ion diffusion, the second is slow growth by electron tunneling. © 1984 The American Physical Society.
W.J. Kozlovsky, W. Lenth, et al.
Applied Physics Letters
A. Moser, E.-E. Latta
Journal of Applied Physics
Maria Ronay, A. Santoni, et al.
Solid State Communications
K.W. Guarini, P. Solomon, et al.
Technical Digest-International Electron Devices Meeting