R.F. Broom
Journal of Applied Physics
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
R.F. Broom
Journal of Applied Physics
R.F. Broom, P. Wolf
Physical Review B
R.F. Broom, W. Jutzi, et al.
IEEE Transactions on Magnetics
J.P. Reithmaier, R.F. Broom, et al.
Applied Physics Letters