N.I. Buchan, A. Jakubowicz, et al.
Applied Physics Letters
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
N.I. Buchan, A. Jakubowicz, et al.
Applied Physics Letters
A. Catana, R.F. Broom, et al.
Journal of Crystal Growth
R.F. Broom, T. Mohr
Thin Solid Films
R.F. Broom, P. Gueret, et al.
ISSCC 1978