Conference paper
Properties of Zn implanted GaN
S. Strite, P.W. Epperlein, et al.
MRS Fall Meeting 1995
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
S. Strite, P.W. Epperlein, et al.
MRS Fall Meeting 1995
R.F. Broom
Journal of Applied Physics
R.F. Broom
Solid-State Electronics
R.F. Broom, W. Jutzi, et al.
IEEE Transactions on Magnetics