The DX centre
T.N. Morgan
Semiconductor Science and Technology
We have been studying a single-layer Co-Cr perpendicular medium with a thickness of 100-700 nm, using a merged MR head designed for longitudinal recording. The Co78Cr22 medium shows good linearity in its output dependence on the MR bias current. The output is 50% larger than that for a longitudinal medium. A maximum D50 value of 100 kFCI was obtained for a medium with an optimum thickness of 300 nm. The medium noise increases with the medium thickness, whereas the output saturates at 300 nm. The thick medium has two demerits: large write demagnetization and a high level of medium noise. Increasing the Cr content of the Co-Cr medium from 22 to 28 at% significantly reduces these two problems. Cr-rich perpendicular media with thicknesses of over 100 nm are expected to replace longitudinal media in hard disk drives in the near future.
T.N. Morgan
Semiconductor Science and Technology
Peter J. Price
Surface Science
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989