Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry

Paper

01 Jan 1980

Abstract

No abstract available.

Conference paper

Shaoning Yao, Wei-Tsu Tseng, et al.

ADMETA 2011

Review

David B. Mitzi

Journal of Materials Chemistry

Paper

Oliver Schilter, Alain Vaucher, et al.

Digital Discovery

Paper

Michael Ray, Yves C. Martin

Proceedings of SPIE - The International Society for Optical Engineering