Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
In this correspondence, the combinatorial properties of traceability codes constructed from error-correcting codes are studied. Necessary and sufficient conditions for traceability codes constructed from maximum-distance separable (MDS) codes are provided. The known sufficient conditions for a traceability code are proven to be also necessary for linear MDS codes.
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
Preeti Malakar, Thomas George, et al.
SC 2012
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Xiaozhu Kang, Hui Zhang, et al.
ICWS 2008