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PaperMapping behavioral specifications to model parameters in synthetic biologyHeinz Koeppl, Marc Hafner, et al.BMC Bioinformatics
Conference paperLithographic characteristics of 193-nm resists imaged at 193 and 248 nmJuliann Opitz, Robert D. Allen, et al.Microlithography 1998
PaperEfficient Heuristics for Orientation Metric and Euclidean Steiner Tree Problems *Y.Y. Li, K.S. Leung, et al.J Combin Optim
