Isotropic treatment of EMF effects in advanced photomasks
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
Suppose ach node (and each edge) of a network is independently faulty with probability at most p (and q, respectively), where 0<p, q<1 are arbitrary constants independent of the size of the network. For each fixed integer d≥2, we construct a network with O(N) nodes and with degree O( log log N) such that, after removing all the faulty nodes and edges, it still contains the N-node d-dimensional N1/d× ... ×N1/d torus, and hence the mesh of the same size, with probability 1 - N-Ω(lof log N). This is derived as a consequence of a simple constant-degree construction which tolerates random faults, where the failure probability of each node is O(log-3dN). We also give a simple constant-degree construction with O(N) nodes that tolerates O(N(1-2-d)/d) worst case faults. © 1996 Academic Press, Inc.
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
M. Shub, B. Weiss
Ergodic Theory and Dynamical Systems
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
F. Odeh, I. Tadjbakhsh
Archive for Rational Mechanics and Analysis