Conference paperMaterials and process integration issues in metal gate/high-k stacks and their dependence on device performanceA.C. Callegari, K. Babich, et al.ECS Meeting 2007
PaperGrain boundary-solute interactions in polycrystalline silicon and germaniumD.A. Smith, C.R.M. Grovenor, et al.Ultramicroscopy
PaperHigh resolution spectrometer coupling to the sub-Å IBM STEMP.E. BatsonMicroscopy and Microanalysis
PaperElectron-energy-loss scattering near a single misfit dislocation at the GaAs/GaInAs interfaceP.E. Batson, K.L. Kavanagh, et al.Physical Review Letters
