Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Electric transport properties of sputtered YBa2Cu3O7-δ films were studied as a function of screw dislocation density, ranging from 5·107 cm-2 to 1.3·109 cm-2 as determined at the film surface. A correlation was found between the number of screw dislocations and the critical current density (Jc). Films with higher screw dislocation densities have higher critical current densities and a slower drop of Jc as a function of applied magnetic field H. © 1992 Springer-Verlag.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry
P.C. Pattnaik, D.M. Newns
Physical Review B