W.H. Henkels
Journal of Applied Physics
The dc I-V characteristics of superconducting thin-film Sn-Au proximity bridges and uniform-thickness Sn microbridges have been carefully analyzed as a function of the directly measured current-phase relation (CPR). At sufficiently low dc current and voltage levels where heating and relaxation time effects are not important, the I-V characteristics are very well described by a shunted weak-link model that includes the proper dc CPR and a shunt resistance.
W.H. Henkels
Journal of Applied Physics
David Seeger, K.T. Kwietniak, et al.
Microelectronic Engineering
R.V. Joshi, W. Hwang, et al.
IEEE International SOI Conference 1998
W.H. Henkels, N.C.-C. Lu, et al.
VLSI Circuits 1989