R. Viswanathan, David Seeger, et al.
Microelectronic Engineering
The dc I-V characteristics of superconducting thin-film Sn-Au proximity bridges and uniform-thickness Sn microbridges have been carefully analyzed as a function of the directly measured current-phase relation (CPR). At sufficiently low dc current and voltage levels where heating and relaxation time effects are not important, the I-V characteristics are very well described by a shunted weak-link model that includes the proper dc CPR and a shunt resistance.
R. Viswanathan, David Seeger, et al.
Microelectronic Engineering
J. Silverman, V. Dimilia, et al.
Microelectronic Engineering
R. Viswanathan, R.E. Acosta, et al.
Microelectronic Engineering
W.H. Henkels, L.M. Geppert, et al.
Journal of Applied Physics