Conference paper
Low temperature 12 ns DRAM
W.H. Henkels, N.C.-C. Lu, et al.
VLSI-TSA 1989
The dc I-V characteristics of superconducting thin-film Sn-Au proximity bridges and uniform-thickness Sn microbridges have been carefully analyzed as a function of the directly measured current-phase relation (CPR). At sufficiently low dc current and voltage levels where heating and relaxation time effects are not important, the I-V characteristics are very well described by a shunted weak-link model that includes the proper dc CPR and a shunt resistance.
W.H. Henkels, N.C.-C. Lu, et al.
VLSI-TSA 1989
W.H. Henkels, N.C.-C. Lu, et al.
Workshop on Low Temperature Semiconductor Electronics 1989
W.H. Henkels, L.M. Geppert, et al.
Journal of Applied Physics
R.E. Acosta, J.R. Maldonado, et al.
Proceedings of SPIE 1989