The DX centre
T.N. Morgan
Semiconductor Science and Technology
A mathematical analysis has been made of the current distribution beyond the edge of the contact in a stripe contact injection laser structure. An analytical solution is obtained for this distribution using a simplified but reasonably accurate model. For a typical stripe-contact laser, the junction current beyond the contact region is equivalent to the current at threshold through an additional stripe width of the order of 10 μm. As a result of such current spreading, lasers with narrow stripe-contacts will have greatly increased apparent threshold current densities. © 1973.
T.N. Morgan
Semiconductor Science and Technology
Hiroshi Ito, Reinhold Schwalm
JES
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.