Ellen J. Yoffa, David Adler
Physical Review B
The use of a dedicated chamber to perform pre-epi deposition cleaning allows native oxide removal with a low thermal budget, and significantly improves throughput of low-temperature Si and SiGe applications. Wafers processed in the cleaning chamber show no detectable contaminants, and the cleansed surface is actually significantly smoother because of cleaning down to a sub-angstrom level.
Ellen J. Yoffa, David Adler
Physical Review B
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arXiv
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Journal of Physics and Chemistry of Solids
H.D. Dulman, R.H. Pantell, et al.
Physical Review B