Y. Watanabe, J.G. Bednorz, et al.
Applied Physics Letters
We show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. Withreference to mono- and bicomponent self-assembled monolayers, we find that the characteristicdepression pattern and the protrusions on a multicomponent film found in STM are to a greatextent due to electronic effects. © 1993 IOP Publishing Ltd.
Y. Watanabe, J.G. Bednorz, et al.
Applied Physics Letters
Bruno Michel, G. Travaglini
Journal of Microscopy
D.G. Schlom, D. Anselmetti, et al.
Physica C: Superconductivity and its applications
R. Linderman, T. Brunschwiler, et al.
THERMINIC 2007