E. Delamarche, Bruno Michel, et al.
Langmuir
We show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. Withreference to mono- and bicomponent self-assembled monolayers, we find that the characteristicdepression pattern and the protrusions on a multicomponent film found in STM are to a greatextent due to electronic effects. © 1993 IOP Publishing Ltd.
E. Delamarche, Bruno Michel, et al.
Langmuir
H. Rohrer, Ch. Gerber
Physical Review Letters
G. Binnig, H. Rohrer, et al.
Surface Science
R. Berger, E. Delamarche, et al.
Applied Physics A: Materials Science and Processing