Sandip Kundu, Sudhakar M. Reddy, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Paper
Diagnosing Scan Chain Faults
Abstract
Testing screens for good chips However, when test fall out is high (low yield) it becomes necessary to diagnose faults so that the manufacturing process or physical design can be fixed to improve yield. Several scan based diagnostic schemes are used in industry. They work when the scan chain itself is fault free. In this paper we describe a diagnosis system that can diagnose faults in a scan chain. © 1994 IEEE
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