Direct measurement of the electron velocity and mean free path in gallium

R.J. Von Gutfeld; A.H. Nethercot Jr.

doi:10.1103/PhysRevLett.18.855

Physical Review Letters

Paper

15 May 1967

Direct measurement of the electron velocity and mean free path in gallium

View publication

Abstract

The Fermi velocity has been measured by a heat-pulse time-of-flight technique near the a axis in gallium. Also, the electron mean free path has been measured in several gallium samples between 1.8 and 4.0°K. © 1967 The American Physical Society.

Paper

Microscope stage sample holder capable of temperature variation between 30 and 800 K

E.E. Tynan, R.J. Von Gutfeld

Review of Scientific Instruments

Paper

Investigation of Laser-Enhanced Electroplating Mechanisms

J. Cl. Puippe, R.E. Acosta, et al.

JES

Paper

The structure of laser written lines in a Te₈₁Ge₁₅As₄ glass

P. Chaudhari, S.R. Herd, et al.

Journal of Non-Crystalline Solids

Paper

Copper microcircuit repair of opens using thermally driven exchange plating

R.J. Von Gutfeld, D.R. Vigliotti

Applied Physics Letters

View all publications

Abstract

Related

Microscope stage sample holder capable of temperature variation between 30 and 800 K

Investigation of Laser-Enhanced Electroplating Mechanisms

The structure of laser written lines in a Te81Ge15As4 glass

Copper microcircuit repair of opens using thermally driven exchange plating

The structure of laser written lines in a Te₈₁Ge₁₅As₄ glass