S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
A technique is described whereby the direct observation of structural changes resulting from electrical switching can be followed in an electron microscope. It is applied to the amorphous chalcogenide alloys and a brief description of the filament that is formed is presented. © 1972.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Joy Y. Cheng, Daniel P. Sanders, et al.
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Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
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