Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Dislocations in imperfect (1 1 1) and (1 0 0) wafers of neodymium gallium garnet (Nd3 Ga5 O12 or NdGG) have been examined using etch pits and the bi-refringence method. Long straight dislocations, large prismatic loops, small prismatic loops, dislocation nodes, and low-angle grain boundaries were observed. The Burgers vectors of some of the dislocations lay along the 〈1 1 0〉 or 〈1 1 1〉 directions. Dislocations with Burgers vectors along 〈1 0 0〉 may have been present, but conclusive evidence for this was not obtained. The diameter of the smallest prismatic loop was 3.1 μm. It is thought to be the smallest dislocation loop observed by the bi-refringence method. The rotation across the low-angle grain boundaries was ∼10-6°. © 1978 Chapman and Hall Ltd.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures