John G. Long, Peter C. Searson, et al.
JES
Self-diffusion measurements have been made in polycrystalline Au-1.2 at.% Ta alloy over the temperature range 204°-395.5 °C using 195Au radioactive tracer and r.f. backsputtering techniques for serial sectioning. Self-diffusion coefficients were obtained in the lattice, dislocation networks (subgrains) and large angle grain boundaries and these yielded Arrhenius parameters for the three diffusion processes. A small addition of Ta to Au was found to have profound effects on Au diffusion in the lattice and along grain boundaries. © 1975.
John G. Long, Peter C. Searson, et al.
JES
Ronald Troutman
Synthetic Metals
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Imran Nasim, Melanie Weber
SCML 2024