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Advanced Materials
Low temperature diffusion of Cr and Si through thin gold films is studied in N2 and in (N2 + CO) ambients. The out-diffusion of both Cr and Si to the gold surface is suppressed in the presence of CO. The results are discussed in terms of a model which considers the roles of both the gold film and the ambients used. © 1980, The Electrochemical Society, Inc. All rights reserved.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
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SPIE Advances in Semiconductors and Superconductors 1990
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