Conference paper
Hot carriers in silicon: femtosecond reflectivity studies.
F.E. Doany, D. Grischkowsky
CLEO 1987
Using a high-performance optoelectronic THz beam system for time-domain spectroscopy, we have measured the absorption and index of refraction of N- and P-type doped GaAs from low frequencies to 4 THz. From these measurements the complex conductance was obtained over the same frequency range. All of the results were well fit by Drude theory.
F.E. Doany, D. Grischkowsky
CLEO 1987
B. Fan, D. Grischkowsky, et al.
Optics Letters
Martin Van Exter, D. Grischkowsky
Physical Review B
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Optics Communications