Hiroshi Ito, Reinhold Schwalm
JES
Results are presented detailing the crystallographic quality of a number of metal films deposited by epitaxial sputter deposition. Such films have single-orientation f.c.c., h.c.p., b.c.c. and hybrid crystal structures, and include the elements Ag, Au, Co, Cr, Cu, Fe, Rh, Ru, Pd and V. The crystal structure was characterized using X-ray diffraction analysis.
Hiroshi Ito, Reinhold Schwalm
JES
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
M. Hargrove, S.W. Crowder, et al.
IEDM 1998