Yasunao Katayama, Yasushi Negishi, et al.
IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Conference paper
Error evaluation algorithm for oneshot Reed-Solomon decoder
Abstract
This paper discusses an error evaluation algorithm for oneshot decoding of Reed-Solomon (RS) codes. The coefficients of new O(t) error polynomials as well as those of the error-locator polynomials for different number of errors are derived in closed and shared formulas for efficient, symbol-parallel, division-free error evaluation.
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