J.P. Locquet, J. Vanacken, et al.
EPL
We report measurements of the "zero field" ac sheet impedance Z = R + iwLk for thin, c-axis-oriented La2-xSrxCuO4 films. For sufficiently thin films of thickness d, the magnetic penetration depth λab, is given by Lk = λ2ab/d. We find that the temperature and intriguing doping dependence of Lk as well as the amplitude of the perpendicular real-space phase correlation length ξφc0 are fully consistent with the critical behaviour of the three-dimensional XY model and finite-size scaling. Moreover, invoking finite-size scaling, we determine the value of the critical amplitude of ξφc0.
J.P. Locquet, J. Vanacken, et al.
EPL
G.J. Norga, A. Guiller, et al.
MRS Proceedings 2003
T. Schneider, E. Simanek
Journal of Physics C: Solid State Physics
S. Sarbach, T. Schneider
Ferroelectrics