M. Frick, T. Schneider
Zeitschrift für Physik B Condensed Matter
We report measurements of the "zero field" ac sheet impedance Z = R + iwLk for thin, c-axis-oriented La2-xSrxCuO4 films. For sufficiently thin films of thickness d, the magnetic penetration depth λab, is given by Lk = λ2ab/d. We find that the temperature and intriguing doping dependence of Lk as well as the amplitude of the perpendicular real-space phase correlation length ξφc0 are fully consistent with the critical behaviour of the three-dimensional XY model and finite-size scaling. Moreover, invoking finite-size scaling, we determine the value of the critical amplitude of ξφc0.
M. Frick, T. Schneider
Zeitschrift für Physik B Condensed Matter
A. Hoffmann, J.W. Seo, et al.
Physical Review B - CMMP
D. Halley, G.J. Norga, et al.
Journal of Applied Physics
A. Scholl, F. Nolting, et al.
Journal of Applied Physics