Mao-Min Chen, Ching Tsang, et al.
IEEE Transactions on Magnetics
We have studied the unidirectional anisotropy field (H) and coercivity (H) in exchange-coupled Ni-Fe/ Fe-Mn, Ni-Fe/Ni-Mn and NiO/Ni-Fe films as functions of thickness and temperature, and evaluated these films for the stabilization of magnetoresistive (MR) sensors. The as-deposited Ni-Fe/Fe-Mn and NiO/Ni-Fe films exhibit strong exchange coupling, while the Ni-Fe/Ni-Mn films require annealing to enhance exchange coupling. Both H and H follow an inverse dependence of the Ni-Fe film thickness in all cases, as expected from the interface nature of exchange coupling. The Fe-Mn film thickness required for the onset of exchange coupling is much smaller than the Ni-Mn and NiO film thicknesses. The thermal stability of the Ni-Fe/Ni-Mn films is superior to that of the Ni-Fe/Fe-Mn and NiO/Ni-Fe films. To explain annealing effects on exchange coupling in the Ni-Fe/Ni-Mn films, we propose an exchange-coupling model consistent with models applied to the Ni-Fe/Fe-Mn and NiO/Ni-Fe films in previous studies. Uniform-field tests of the MR sensors longitudinally biased by the three types of exchange-coupled films show quiet and stable MR responses in all cases. We evaluate the exchange-coupled films based on desired properties for the sensor stabilization, and then discuss their merits and deficiencies. © 1995 IEEE
Mao-Min Chen, Ching Tsang, et al.
IEEE Transactions on Magnetics
Tsann Lin, Daniele Mauri, et al.
Applied Physics Letters
Grace L. German, Lang Vo, et al.
IEEE Transactions on Magnetics
Ching Tsang, Robert E. Fontana, et al.
IEEE Transactions on Magnetics