D.A. Richie, P. Von Allmen, et al.
VLSI Design
X-ray absorption spectrum of the Sm LIII edge has been measured in mixed-valence Sm0.75Y0.25S. From analysis of the edge structure and extended x-ray absorption fine structure, the valence is determined and it is shown that the S neighbors of each Sm atom adopt an average distance rather than a dynamically distorted environment with two distances corresponding to the two valence states. From this it is concluded that the characteristic Sm 4f-band width is not greatly modified by polaron effects. © 1980 The American Physical Society.
D.A. Richie, P. Von Allmen, et al.
VLSI Design
Giulia Galli, Richard M. Martin, et al.
Science
Chris G. Van De Walle, Richard M. Martin
Physical Review B
J.-S. Kang, J.W. Allen, et al.
Physical Review B