Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Hyperfine parameters obtained from experimental techniques such as electron paramagnetic resonance contain a wealth of information about defects in semiconductors. Detailed structural information can only be extracted, however, if accurate calculations are available with which the experimental quantities can be compared. We show that reliable values for hyperfine parameters can be obtained from first-principles calculations based on spin-density-functional theory and pseudopotentials. We present a method that overcomes the complication that the wave functions in the core region are not directly available in a pseudopotential formalism. The power of the approach will be illustrated with examples for a number of different defect systems, including H in various semiconductors (Si, GaAs, and ZnSe), and the Zn interstitial in ZnSe. © 1993 The American Physical Society.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Michiel Sprik
Journal of Physics Condensed Matter
Peter J. Price
Surface Science
Mark W. Dowley
Solid State Communications