Soft x-ray diffraction of striated muscle
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Ballistic Electron Emission Microscopy (BEEM) is shown to be a versatile new tool for the study of hot electron phenomena in metal-oxide-semiconductor structures. The elusive problem of measuring oxide charge distributions is largely overcome by suitable modeling of the field dependent threshold shifts for both preexisting defects and stress induced traps. Local oxide breakdowns were seldom observed, and then only after injecting charge dosages that exceeded by several orders of magnitude the best values reported on macroscopic samples.
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
David B. Mitzi
Journal of Materials Chemistry
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials