PaperParticipation of carbon in the electronic structure of YBa2Cu3O7P.E. Batson, T.M. Shaw, et al.Physical Review B
PaperParallel detection for high-resolution electron energy loss studies in the scanning transmission electron microscopeP.E. BatsonReview of Scientific Instruments
Conference paperMaterials and process integration issues in metal gate/high-k stacks and their dependence on device performanceA.C. Callegari, K. Babich, et al.ECS Meeting 2007
