Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
In this paper we describe the results of high-resolution transmission electron microscopy studies of MBE-grown Co/Pt superlattices. These studies were made on superlattices grown along the three major axes of Pt: [111], [110], [001], on Ag films grown on GaAs substrates. Cross-section, transmission electron micrographs of [3.2Å Co-16.7 Å Pt]n superlattices reveal a high density of stacking faults on the (111) planes for [111] oriented superlattices. In addition, plane-view transmission electron diffraction patterns showed intense Bragg diffractions originating from a high density of steps and stacking faults in the superlattice. For the [110] and [001] oriented superlattices stacking faults were not observed. It is suggested that a combination of limited interdiffusion, partial ordering of the alloy and stacking faults may contribute to the suggested that a combination of limited interdiffusion, partial ordering of the alloy and stacking faults may contribute to the perpendicular anisotropy observed for the [111] superlattices. © 1991.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Gregory Czap, Kyungju Noh, et al.
APS Global Physics Summit 2025
A. Krol, C.J. Sher, et al.
Surface Science
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications