O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
A high surface concentration layer is essential for obtaining good ohmic contact on GaAs devices. Zn diffusion in GaAs using Zn3As2, ZnAs2, Zn3As2 + ZnAs2, and ZnAs2 + As as diffusion sources at low temperatures (600°-730'C) has been studied. The resulting surfaces were reproducible and undamaged, and the surface concentrations were in the 1020 cm-3 range. © 1976, The Electrochemical Society, Inc. All rights reserved.
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
J.C. Marinace
JES