E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
The diffraction intensities from a corrugated hard wall are shown to be the same for a given corrugation function ζ(x, y) and −ζ(−x, −y), provided that coupling to evanescent waves is negligible. To illustrate the consequences of this ambiguity for both surface structure and surface bonding, the corrugation of the adsorbate system Ni(110) + H(1 × 2) determined from Hediffraction measurements is considered. Possible conditions under which the ambiguity could be resolved are discussed. © 1980, All rights reserved.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
E. Burstein
Ferroelectrics
T.N. Morgan
Semiconductor Science and Technology
R. Ghez, M.B. Small
JES