PaperWill OLED displays challenge liquid crystal displays in notebook computer applications?Ronald TroutmanSynthetic Metals
Conference paperNEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.S. Cohen, T.O. Sedgwick, et al.MRS Proceedings 1983
Conference paperCompression for data archiving and backup revisitedCorneliu ConstantinescuSPIE Optical Engineering + Applications 2009