Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
An energy analyser is described for measuring the energy of the secondary electrons in the scanning electron microscope. It consists of a 63°deflection cylindrical analyser followed by an electron collimator. This is simpler than a mirror design reported previously and gives a higher transmission factor and less defocusing of the electron beam of the microscope. This analyser has been applied to measure point-to-point variations in surface potential with an accuracy to ±1 V.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
J. Tersoff
Applied Surface Science