The DX centre
T.N. Morgan
Semiconductor Science and Technology
Soft x-ray resonant magnetic diffraction at the Nd M edges was performed on a NdNi O3 epitaxial film to investigate the magnetic ordering of the Nd ions below the metal-insulator transition. A noncollinear magnetic structure induced by the Ni magnetic moments best describes the azimuthal angle dependency of the (1 2,0,1 2) reflection. This confirms the Ni spin structure observed with soft x-ray diffraction experiments performed at the Ni L edge, providing further evidence of charge disproportionation without orbital order below the metal-insulator transition in NdNi O3. © 2008 The American Physical Society.
T.N. Morgan
Semiconductor Science and Technology
K.N. Tu
Materials Science and Engineering: A
Ming L. Yu
Physical Review B
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science